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https://www.productionai.institute/graph/events/evt-aiid-214

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Production AI Institute public record · AI Incident Database: SN Technologies Reportedly Lied to a New York State School District about Its Facial and Weapon Detection Systems’ Performance · observed 2022-05-30
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AI Incident Database: SN Technologies Reportedly Lied to a New York State School District about Its Facial and Weapon Detection Systems’ Performance

SN Technologies allegedly misled Lockport City Schools about the performance of its AEGIS face and weapons detection systems, downplaying error rates for Black faces and weapon misidentification.

AI Incident Database · Incident 214

Operator lens (medium): inspect D1 (input boundary), D4 (observability), D5 (model change gate).

Confidence
78%
Sources
2
Entities
6
Detected
detected 1511d ago

Event summary

SN Technologies allegedly misled Lockport City Schools about the performance of its AEGIS face and weapons detection systems, downplaying error rates for Black faces and weapon misidentification.

D1D4D5D6

Linked entities

  • sn-technologies

    organisation | 70%

  • lockport-city-school-district

    organisation | 70%

  • black-students

    organisation | 70%

  • students

    organisation | 70%

  • educational-communities

    organisation | 70%

  • epistemic-integrity

    organisation | 70%

Related graph edges

EdgeTypeConfidence
ent-aiid-sn-technologies to ent-psf-d1maps to60%
ent-aiid-sn-technologies to ent-psf-d1maps to60%
ent-aiid-sn-technologies to ent-psf-d1maps to60%
ent-aiid-sn-technologies to ent-psf-d4maps to60%
ent-aiid-sn-technologies to ent-psf-d4maps to60%
ent-aiid-sn-technologies to ent-psf-d4maps to60%
ent-aiid-sn-technologies to ent-psf-d5maps to60%
ent-aiid-sn-technologies to ent-psf-d5maps to60%
ent-aiid-sn-technologies to ent-psf-d5maps to60%
ent-aiid-sn-technologies to ent-psf-d6maps to60%
ent-aiid-sn-technologies to ent-psf-d6maps to60%
ent-aiid-sn-technologies to ent-psf-d6maps to60%

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Event dates

  • Happened 2 Jan 2020

  • Detected 30 May 2022

Sources

  • AI Incident Database - Incident 214

    secondary | checked 9 July 2026

    Open source
  • Facial Recognition Company Lied to School District About its Racist Tech

    secondary | checked 30 May 2022

    Open source
Cite this record

"AI Incident Database: SN Technologies Reportedly Lied to a New York State School District about Its Facial and Weapon Detection Systems’ Performance." https://www.productionai.institute/graph/events/evt-aiid-214 (observed 2020-01-02; retrieved 2026-07-19). PAI.

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